Micro focal point X-ray digital microscopic system

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Micro focal point X-ray digital microscopic system
Posting date : Jun 02, 2010
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84-
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Lanzhou Sanlei Electronics Co., Ltd in accordance with its continuous innovative spirit develops micro focal point X-ray digital microscopic system,the cubic content is small,the weight is light, the integration rate is high, and the operation is easy. The system contains 0.5 micron micro focal point X-ray machine, the image enhancement meter or the digital image plate, the multi-function image analysis software and the multi-degree-of-freedom objective table,which has the high detection speed and the high enlargement factor (the highest can achieve 10,000 times), and is the most effective tools of semiconductor non-destructiveness inspection internal structure and flaw. Applied Range The flaw of the integrated circuit (IC) seals, for example: complete a?detection of level decollement, burst, cavity and leading wire. The flaw of printed circuit assembly manufacture, for example?bad alignment or the bridge joint. Sensor detection. Wafer type chip seal In various types connection line possibly produces the opening, short-circuits the flaw examination which or is not normal connects? The complete detection of tin ball array seal and duplicate chip seal tin ball. Technical Data: Max voltage 160KV Focus size 0.5祄 Max current 500礎 Enlargement factor 2000~9000 Max size WindowsXp Max bear 5Kg

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