Product Name:
Test Sphere Dia 50 mm with Handle ZLT-I01
Model No:
ZLT-I01
Price Terms:
Ex-work, CIF ,FOB
Standards:
IEC61032 test probe A and IEC60529 IP1 and other standard
…
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It is used for the measurement of the temperature radiated by different equipment during the tests from heating.
IEC 600…
MJ-870 PCIE NAND Test Fixture is New 4-IN-1 iPhone Motherboard restore repair tool, iphone PCIE NAND Test Fixture is designed to test the NAND Status (Bad or Good), also can be used to Reinstall &…
Food Test Dishwasher Safe Not Transformed Easy To Use Utility Durable Beautiful Cheese Knife,Website:http://www.helloknifechina.com,Coating Cheese Knife
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